_MG_7958.jpg

A focused-ion-beam scanning-electron microscope, capable of drilling a hole in a piece of dust, will help provide a nanoscopic look at the asteroid sample from OSIRIS-REx. (Photo: Mari Cleven/UA Office of Research, Discovery and Innovation) A focused-ion-beam scanning-electron microscope, capable of drilling a hole in a piece of dust, will help provide a nanoscopic look at the asteroid sample from OSIRIS-REx.